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Pure Appl. Chem., 2005, Vol. 77, No. 12, pp. 2149-2170


Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

John Ralston1*, Ian Larson2, Mark W. Rutland3, Adam A. Feiler4 and Mieke Kleijn5

1 Ian Wark Research Institute, University of South Australia, Mawson Lakes Campus, Adelaide, SA 5095, Australia
2 Department of Pharmaceutics, Victorian College of Pharmacy, Monash University, 381 Royal Parade, Parkville Vic 3052, Australia
3 Institute for Surface Chemistry, P.O. Box 5607, 114 86 Stockholm, Sweden
4 Department of Chemistry, Surface Chemistry, Royal Institute of Technology, 100 44 Stockholm, Sweden
5 Laboratory of Physical Chemistry and Colloid Science, P.O. Box 8038, 6700 EK Wageningen, The Netherlands

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