Pure and Applied Chemistry

Author detail

Articles by Mark W. Rutland

• John Ralston, Ian Larson, Mark W. Rutland, Adam A. Feiler and Mieke Kleijn

  Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

  2005, Vol. 77, Issue 12, pp. 2149-2170 [Details + Abstract] [Full text - pdf 510 kB]

Coauthors

• Mieke Kleijn (1 article)
• Adam A. Feiler (1 article)
• John Ralston (1 article)
• Ian Larson (1 article)

Affiliations

• Institute for Surface Chemistry, P.O. Box 5607, 114 86 Stockholm, Sweden