Pure and Applied Chemistry

Author detail

Articles by Adam A. Feiler

• John Ralston, Ian Larson, Mark W. Rutland, Adam A. Feiler and Mieke Kleijn

  Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

  2005, Vol. 77, Issue 12, pp. 2149-2170 [Details + Abstract] [Full text - pdf 510 kB]

Coauthors

• Mark W. Rutland (1 article)
• Mieke Kleijn (1 article)
• Ian Larson (1 article)
• John Ralston (1 article)

Affiliations

• Department of Chemistry, Surface Chemistry, Royal Institute of Technology, 100 44 Stockholm, Sweden