Pure and Applied Chemistry

Author detail

Articles by Mieke Kleijn

• John Ralston, Ian Larson, Mark W. Rutland, Adam A. Feiler and Mieke Kleijn

  Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

  2005, Vol. 77, Issue 12, pp. 2149-2170 [Details + Abstract] [Full text - pdf 510 kB]

Coauthors

• John Ralston (1 article)
• Mark W. Rutland (1 article)
• Adam A. Feiler (1 article)
• Ian Larson (1 article)

Affiliations

• Laboratory of Physical Chemistry and Colloid Science, P.O. Box 8038, 6700 EK Wageningen, The Netherlands