Pure Appl. Chem., 1998, Vol. 70, No. 6, pp. 1151-1156
http://dx.doi.org/10.1351/pac199870061151
Treatment of dust particles in an RF plasma monitored by Mie scattering rotating compensator ellipsometry
Individual author index pages
Other PAC articles by these authors
Metal halide lamps: Gravitational influence on color separation
Formation of dense submicronic clouds in low pressure Ar-SiH4 RF reactor: Diagnostics and growth processes from monomers to large size particulates
Expanding plasma used for plasma deposition
On the plasmaphysics of plasma-etching