Treatment of dust particles in an RF plasma monitored by Mie scattering 
          rotating compensator ellipsometry

PAC → Archive → Vol. 70 (1998) → Issue 6 → Treatment of dust particles in an RF…

Pure Appl. Chem., 1998, Vol. 70, No. 6, pp. 1151-1156

http://dx.doi.org/10.1351/pac199870061151

G. H. P. M. Swinkels, E. Stoffels, W. W. Stoffels, N. Simons, G. M. W. Kroesen and F. J. de Hoog

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Pure and Applied Chemistry