Pure Appl. Chem., 1994, Vol. 66, No. 6, pp. 1373-1380
http://dx.doi.org/10.1351/pac199466061373
Plasma and surface diagnostics in PECVD (plasma-enhanced chemical vapor deposition) from silicon containing organic monomers
Individual author index pages
Other PAC articles by these authors
Deposition mechanism of nanostructured thin films from tetrafluoroethylene glow discharges
Process control of organosilicon plasmas for barrier film preparations
The chemistry of etching and deposition processes
Chemistry of titanium dry etching in fluorinated and chlorinated gases
Mechanism of etching, polymerization and deposition in R.F. (radio frequency) discharges