Pure and Applied Chemistry, 1992, Volume 64, No. 4, pp. 485-495, Other PAC articles by these authors

PAC → Archive → Vol. 64 (1992) → Issue 4 → Solid state mass spectrometry for materials… → Other PAC articles by these authors

Pure Appl. Chem., 1992, Vol. 64, No. 4, pp. 485-495

http://dx.doi.org/10.1351/pac199264040485

Solid state mass spectrometry for materials science

M. Grasserbauer

M. Grasserbauer

Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides

M. Grasserbauer, Yu. A. Zolotov and G. H. Morrison

General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis

Yu. A. Zolotov and M. Grasserbauer

General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis

M. Grasserbauer, K. F. J. Heinrich and G. H. Morrison

Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)