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Pure Appl. Chem., 1987, Vol. 59, No. 2, pp. 229-244

http://dx.doi.org/10.1351/pac198759020229

COMMISSION OF MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS

Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)

A. A. Galuska and G. H. Morrison

Individual author index pages

Other PAC articles by these authors

Subhash Chandra, E. W. Sod, W. A. Ausserer and G. H. Morrison
Preparation of biological samples for ion microscopy (Technical Report)
1992, Vol. 64, Issue 2, pp. 245-252 [Details] [Full text - pdf 2869 kB]
M. Grasserbauer, Yu. A. Zolotov and G. H. Morrison
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
1985, Vol. 57, Issue 8, pp. 1153-1170 [Details] [Full text - pdf 310 kB]
M. Grasserbauer, K. F. J. Heinrich and G. H. Morrison
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
1983, Vol. 55, Issue 12, pp. 2023-2027 [Details] [Full text - pdf 122 kB]
O. G. Koch, P. D. LaFleur and G. H. Morrison
General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements
1982, Vol. 54, Issue 8, pp. 1565-1577 [Details] [Full text - pdf 280 kB]
G. H. Morrison
General aspects of trace analytical methods I. Methods of calibration in trace analysis
1975, Vol. 41, Issue 3, pp. 395-402 [Details] [Full text - pdf 135 kB]