Author detail
Articles by G. H. Morrison
- Preparation of biological samples for ion microscopy (Technical Report)
- Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
- General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
- Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
- General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements
- General aspects of trace analytical methods I. Methods of calibration in trace analysis
The following name might also represent this author:
G. Morrison
- Alternative refrigerant properties measurement and correlation program at NIST (national institute of standards and technology)
Coauthors
- M. Grasserbauer (2 articles)
- W. A. Ausserer (1 article)
- Subhash Chandra (1 article)
- P. D. LaFleur (1 article)
- Yu. A. Zolotov (1 article)
- A. A. Galuska (1 article)
- O. G. Koch (1 article)
- K. F. J. Heinrich (1 article)
- E. W. Sod (1 article)