Pure Appl. Chem., 1987, Vol. 59, No. 2, pp. 229-244
http://dx.doi.org/10.1351/pac198759020229
COMMISSION OF MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
Individual author index pages
Other PAC articles by these authors
Preparation of biological samples for ion microscopy (Technical Report)
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements
General aspects of trace analytical methods I. Methods of calibration in trace analysis