Pure Appl. Chem., 1985, Vol. 57, No. 8, pp. 1133-1152
http://dx.doi.org/10.1351/pac198557081133
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
Individual author index pages
Other PAC articles by these authors
Solid state mass spectrometry for materials science
Separation and Preconcentration of Trace Substances - V. Microscale preconcentration techniques for trace analysis
Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides
New methods for preconcentration and determination of heavy metals in natural water
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
Preconcentration in inorganic trace analysis
Determination of microelements in geological samples
Extraction kinetics of metal chelates