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Pure Appl. Chem., 1982, Vol. 54, No. 8, pp. 1565-1577


General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements

O. G. Koch, P. D. LaFleur and G. H. Morrison

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Subhash Chandra, E. W. Sod, W. A. Ausserer and G. H. Morrison
Preparation of biological samples for ion microscopy (Technical Report)
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Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
1987, Vol. 59, Issue 2, pp. 229-244 [Details] [Full text - pdf 339 kB]
M. Grasserbauer, Yu. A. Zolotov and G. H. Morrison
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
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M. Grasserbauer, K. F. J. Heinrich and G. H. Morrison
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
1983, Vol. 55, Issue 12, pp. 2023-2027 [Details] [Full text - pdf 122 kB]
G. H. Morrison
General aspects of trace analytical methods I. Methods of calibration in trace analysis
1975, Vol. 41, Issue 3, pp. 395-402 [Details] [Full text - pdf 135 kB]