Pure Appl. Chem., 1975, Vol. 41, No. 3, pp. 395-402
http://dx.doi.org/10.1351/pac197541030395
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS OF THE ANALYTICAL CHEMISTRY DIVISION
General aspects of trace analytical methods I. Methods of calibration in trace analysis
Individual author index pages
Other PAC articles by these authors
Preparation of biological samples for ion microscopy (Technical Report)
Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements