CrossRef enabled

PAC Archives

Archive →

Pure Appl. Chem., 2011, Vol. 83, No. 11, pp. iv


V. Rajendran, Burkard Hillbrands and Kurt E. Geckeler

The International Conference on Nanomaterials and Nanotechnology (NANO-2010) was organized by the Center for Nanoscience and Technology (CNST), K.S. Rangasamy College of Technology, in association with the Department of Nanobio Materials and Electronics (DNE), World Class University (WCU), Gwangju Institute of Science and Technology (GIST), South Korea, and the Technische Unversität Kaiserslautern, Germany, from 13 to 16 December 2010. The interdisciplinary conference was held at the KSRCT, Tiruchengode, Tamil Nadu, India, and included a series of scientific lectures, an exhibition, and a panel discussion with funding agencies such as the DST, Defense Research and Development Organization (DRDO), DAE, and the Council for Scientific and Industrial Research (CSIR).

In addition, a special session for DRDO was arranged, including a benefit for the delegates to explore potential areas of collaboration with the DRDO laboratories. This special session on the “Application of Nanotechnology for National Security” was held 14 December 2010. Also, 13 companies exhibited their products in the exhibition hall. Distinguished persons from various funding agencies participated in the panel discussion to identify the road map for nanotechnology in India. The conference was enlightened by three plenary lectures, which included one given by Prof. Dr. Richard Ernst, Nobel laureate. In addition, 39 invited lectures and more than 560 contributed papers from over 24 countries were presented.

We would like to thank IUPAC for coming forward to publish the invited papers in Pure and Applied Chemistry. Out of 39 invited lectures, 12 papers were accepted after peer review for publication. We also thank IUPAC for sponsoring this event.

Our special thanks are due to the reviewers for their help with critical reviews and detailed comments on the manuscripts and also to the speakers for considering the reviewers’ comments.

V. Rajendran, Burkard Hillbrands, and Kurt E. Geckeler
Conference Editors