CrossRef enabled

PAC Archives

Archive →

Pure Appl. Chem., 1999, Vol. 71, No. 7, pp. 1337-1357

http://dx.doi.org/10.1351/pac199971071337

ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS

Classification of Scanning Probe Microscopies

Gernot Friedbacher and Harald Fuchs

CrossRef Cited-by theme picture

CrossRef Cited-by Linking

  • López-Serrano Ana, Olivas Riansares Muñoz, Landaluze Jon Sanz, Cámara Carmen: Nanoparticles: a global vision. Characterization, separation, and quantification methods. Potential environmental and health impact. Anal. Methods 2014, 6, 38. <http://dx.doi.org/10.1039/c3ay40517f>
  • Neugebauer Sebastian, Zimdars Andreas, Liepold Petra, Gębala Magdalena, Schuhmann Wolfgang, Hartwich Gerhard: Optimization of an Electrochemical DNA Assay by Using a 48-Electrode Array and Redox Amplification Studies by Means of Scanning Electrochemical Microscopy. Chem Eur J of Chem Bio 2009, 10, 1193. <http://dx.doi.org/10.1002/cbic.200800767>
  • Basnar Bernhard, Willner Itamar: Dip-Pen-Nanolithographic Patterning of Metallic, Semiconductor, and Metal Oxide Nanostructures on Surfaces. Small 2009, 5, 28. <http://dx.doi.org/10.1002/smll.200800583>
  • KUNZE S., LEMKE K., METZE J., BLOUKAS G., KOTTA K., PANAGIOTIDIS C. H., SKLAVIADIS T., BODEMER W.: Atomic force microscopy to characterize the molecular size of prion protein : AFM IMAGES OF SINGLE PRION PROTEIN MOLECULES. J Microsc 2008, 230, 224. <http://dx.doi.org/10.1111/j.1365-2818.2008.01979.x>
  • Zens Aloisia Saiz, Appel Tamara, Broekaert Jose A. C., Friedel Frank: Determination of retained austenite in multiphase steels by magnetic force microscopy. IJMR 2006, 97, 1158. <http://dx.doi.org/10.3139/146.101353>
  • Stark Robert, Schitter Georg, Stark Martin, Guckenberger Reinhard, Stemmer Andreas: State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy. Phys Rev B 2004, 69, 085412. <http://dx.doi.org/10.1103/PhysRevB.69.085412>
  • Paredes J.I, Martı́nez-Alonso A, Tascón J.M.D: Application of scanning tunneling and atomic force microscopies to the characterization of microporous and mesoporous materials. Microp Mesop Mat 2003, 65, 93. <http://dx.doi.org/10.1016/j.micromeso.2003.07.001>
  • Bonnell Dawn A, Shao Rui: Local behavior of complex materials: scanning probes and nano structure. Curr Opin Solid State Mater 2003, 7, 161. <http://dx.doi.org/10.1016/S1359-0286(03)00047-0>
  • Basnar B., Lugstein A., Wanzenboeck H., Langfischer H., Bertagnolli E., Gornik E.: Focused ion beam induced surface amorphization and sputter processes. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 2003, 21, 927. <http://dx.doi.org/10.1116/1.1565345>
  • Stark M., Stark R. W., Heckl W. M., Guckenberger R.: Inverting dynamic force microscopy: From signals to time-resolved interaction forces. Proceedings of the National Academy of Sciences 2002, 99, 8473. <http://dx.doi.org/10.1073/pnas.122040599>
  • Biswas Sujit K., Schujman Sandra B., Vajtai Robert, Wei Bingqing, Parker Allen, Schowalter Leo J., Ajayan Pulickel M.: AFM-based Electrical Characterization of Nano-structures. Mat Res Symp Proc 2002, 738, G9.2. <http://dx.doi.org/10.1557/PROC-738-G9.2>
  • Biswas Sujit K., Schujman Sandra B., Vajtai Robert, Wei Bingqing, Parker Allen, Schowalter Leo J., Ajayan Pulickel M.: AFM-based Electrical Characterization of Nano-structures. MRS Proc 2002, 761, NN6.2/G9.2. <http://dx.doi.org/10.1557/PROC-761-NN6.2/G9.2>
  • Kasas S, Khanmy-Vital A, Dietler G: Examination of line crossings by atomic force microscopy. Forensic Sci Int 2001, 119, 290. <http://dx.doi.org/10.1016/S0379-0738(00)00458-8>