Pure and Applied Chemistry, 1996, Volume 68, No. 8, pp. 1657-1663, Cited by

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Pure Appl. Chem., 1996, Vol. 68, No. 8, pp. 1657-1663

http://dx.doi.org/10.1351/pac199668081657

COMMISSION ON HIGH TEMPERATURE AND SOLID STATE CHEMISTRY

Quantitative analysis of PbO-SiO₂ glass by electron microprobe (Technical Report)

J. Matousek, V. Hulínsky, R. Metselaar and J. Corish

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Schalm O., Janssens K.: A flexible and accurate quantification algorithm for electron probe X-ray microanalysis based on thin-film element yields. ATOM SPECTROSC 2003, 58, 669. <http://dx.doi.org/10.1016/S0584-8547(02)00290-2>