Pure Appl. Chem., 1996, Vol. 68, No. 5, pp. 1071-1074
http://dx.doi.org/10.1351/pac199668051071
Surface chemistry during plasma etching of silicon
Individual author index pages
Other PAC articles by these authors
Experimental and modeling study of O and Cl atoms surface recombination reactions in O2 and Cl2 plasmas