Pure Appl. Chem., 1993, Vol. 65, No. 11, pp. 2361-2372
http://dx.doi.org/10.1351/pac199365112361
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Depth of origin of sputtered atoms (Technical Report)
Individual author index pages
Other PAC articles by these authors
Laser ionization of sputtered atoms: Trace analysis of samples with atomic dimensions (Technical Report)