Pure Appl. Chem., 1993, Vol. 65, No. 11, pp. 2361-2372
http://dx.doi.org/10.1351/pac199365112361
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Depth of origin of sputtered atoms (Technical Report)
CrossRef Cited-by Linking
- Wittmaack Klaus: Energy- and angle-resolved depth of origin of isotopes sputtered from an elemental target. Phys Rev B 1997, 56, R5701. <http://dx.doi.org/10.1103/PhysRevB.56.R5701>
- Lill Th., Calaway W.F., Ma Z., Pellin M.J.: Sputtering of Group-IIIa elements. Properties of the metal cluster formation mechanism. Surf Sei 1995, 322, 361. <http://dx.doi.org/10.1016/0039-6028(95)90044-6>
- Lill Th., Calaway W. F., Pellin M. J.: Cluster emission during sputtering of liquid gallium-aluminum eutectic alloy. J Appl Phys 1995, 78, 505. <http://dx.doi.org/10.1063/1.360633>