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Pure Appl. Chem., 1993, Vol. 65, No. 11, pp. 2361-2372

http://dx.doi.org/10.1351/pac199365112361

ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS

Depth of origin of sputtered atoms (Technical Report)

M. J. Pellin and J. W. Burnett

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