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Pure Appl. Chem., 1992, Vol. 64, No. 4, pp. 485-495

http://dx.doi.org/10.1351/pac199264040485

Solid state mass spectrometry for materials science

M. Grasserbauer

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  • Galler Patrick, Raab Andrea, Freitag Sabine, Blandhol Kjell, Feldmann Jörg: Boron speciation in acid digests of metallurgical grade silicon reveals problem for accurate boron quantification by inductively coupled plasma – optical emission spectroscopy. J. Anal. At. Spectrom. 2014, 29, 614. <http://dx.doi.org/10.1039/c3ja50383f>
  • Broekaert José A. C.: Analytische Atomspektrometrie. Nachr Chem Tech Lab 2010, 42, M1. <http://dx.doi.org/10.1002/nadc.19940420315>
  • SASTRI C, BLONDIAUX G, PETRI H: Trace determination of carbon, sodium, magnesium and aluminum in metals and ceramic materials by low energy deuteron activation analysis. Nuclear Instruments and Methods in Physics Research B 1997, 124, 558. <http://dx.doi.org/10.1016/S0168-583X(97)00108-0>