Pure Appl. Chem., 1988, Vol. 60, No. 3, pp. 437-444
http://dx.doi.org/10.1351/pac198860030437
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides
Individual author index pages
Other PAC articles by these authors
Solid state mass spectrometry for materials science
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)