Pure and Applied Chemistry, 1985, Volume 57, No. 10, pp. 1373-1382, Cited by

Pure Appl. Chem., 1985, Vol. 57, No. 10, pp. 1373-1382

http://dx.doi.org/10.1351/pac198557101373

Electron microscopy and diffraction of modulated structures

J. Van Landuyt, G. Van Tendeloo and S. Amelinckx

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