Pure Appl. Chem., 1985, Vol. 57, No. 10, pp. 1373-1382
http://dx.doi.org/10.1351/pac198557101373
Electron microscopy and diffraction of modulated structures
First page:
Pure Appl. Chem., 1985, Vol. 57, No. 10, pp. 1373-1382
http://dx.doi.org/10.1351/pac198557101373