Pure Appl. Chem., 1983, Vol. 55, No. 12, pp. 2023-2027
http://dx.doi.org/10.1351/pac198355122023
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
CrossRef Cited-by Linking
- Novikov Yu. A.: Resolution of a scanning electron microscope: 1. Current state of the problem. J. Synch. Investig. 2013, 7, 497. <http://dx.doi.org/10.1134/S1027451013030105>
- Liu Yu, Li Xian-Hua, Li Qiu-Li, Tang Guo-Qiang, Yin Qing-Zhu: Precise U–Pb zircon dating at a scale of <5 micron by the CAMECA 1280 SIMS using a Gaussian illumination probe. J Anal At Spectrom 2011, 26, 845. <http://dx.doi.org/10.1039/c0ja00113a>
- Seah M. P.: VAMAS surface chemical analysis technical working party: An update for 1988. Surf Interface Anal 1989, 14, 407. <http://dx.doi.org/10.1002/sia.740140619>
- Powell C. J.: The development of standards for surface analysis. Surf Interface Anal 1988, 11, 103. <http://dx.doi.org/10.1002/sia.740110113>
- Grasserbauer M., Stingeder G., Pötzl H., Guerrero E.: Analytical science for the development of microelectronic devices. Fresenius Zeitschrift fur Analytische Chemie 1986, 323, 421. <http://dx.doi.org/10.1007/BF00470757>