Pure Appl. Chem., 1982, Vol. 54, No. 2, pp. 323-336
http://dx.doi.org/10.1351/pac198254020323
Ion beam methods for the surface characterization of polymers
CrossRef Cited-by Linking
- Romand M., Charbonnier M.: Surface analysis of some polymer-based materials by means of a soft X-ray emission technique. Journal of Adhesion Science and Technology 2001, 15, 945. <http://dx.doi.org/10.1163/15685610152542388>
- Wee A.T.S., Huan C.H.A., Gopalakrishnan R., Tan K.L., Kang E.T., Neoh K.G., Shirakawa H.: Static SIMS of polyacetylene: the effect of chain unsaturation. Synthetic Metal 1991, 45, 227. <http://dx.doi.org/10.1016/0379-6779(91)91807-M>
- Van Ooij W. J., Brinkhuis R. H. G.: Interpretation of the fragmentation patterns in static SIMS analysis of polymers. Part I. Simple aliphatic hydrocarbons. Surf Interface Anal 1988, 11, 430. <http://dx.doi.org/10.1002/sia.740110805>
- De Puydt Y., Bertrand P., Lutgen P.: Study of the Al/PET interface in relation with adhesion. Surf Interface Anal 1988, 12, 486. <http://dx.doi.org/10.1002/sia.740120903>
- Adams F., Moens M.: Recent developments in ion microscopy. ATOM SPECTROSC 1987, 42, 1013. <http://dx.doi.org/10.1016/0584-8547(87)80130-1>
- Garbassi F., Occhiello E.: Spectroscopic techniques for the analysis of polymer surfaces and interfaces. Analytica Chimica Acta 1987, 197, 1. <http://dx.doi.org/10.1016/S0003-2670(00)84710-8>
- Brown A., Vickerman J. C.: Static SIMS for applied surface analysis. Surf Interface Anal 1984, 6, 1. <http://dx.doi.org/10.1002/sia.740060102>