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Pure Appl. Chem., 1978, Vol. 50, No. 9-10, pp. 1091-1098

http://dx.doi.org/10.1351/pac197850091091

Silver and copper ion conductors in the solid state

T. Takahashi

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  • Blanton Thomas, Misture Scott, Dontula Narasimharao, Zdzieszynski Swavek: In situ high-temperature X-ray diffraction characterization of silver sulfide, Ag2S. Powder Diff 2011, 26, 114. <http://dx.doi.org/10.1154/1.3583564>
  • Shabanov O. M., Kachaev R. T., Iskakova A. A., Gadzhiev S. M., Pashaev A. P.: Conductivity of α-AgI and its melt in high-intensity pulsed electric fields. Russ J Electrochem 2009, 45, 356. <http://dx.doi.org/10.1134/S1023193509030185>
  • Schultz Peter L., Hsu Keng H., Fang Nicholas X., Ferreira Placid M.: Solid-state electrochemical nanoimprinting of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 2007, 25, 2419. <http://dx.doi.org/10.1116/1.2799977>
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