Pure and Applied Chemistry, 1978, Volume 50, No. 2, pp. 87-95

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Pure Appl. Chem., 1978, Vol. 50, No. 2, pp. 87-95

http://dx.doi.org/10.1351/pac197850020087

Trace analysis of organic compounds

Klaus Beyermann

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International Symposium on Microchemical Techniques, Davos, Switzerland, 22–27 May 1977

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