Pure and Applied Chemistry, 1975, Volume 42, No. 1-2, pp. 177-188

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Pure Appl. Chem., 1975, Vol. 42, No. 1-2, pp. 177-188

http://dx.doi.org/10.1351/pac197542010177

The value of worldwide pesticide residue monitoring systems

C. L. Dunn

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Conference

Third International Congress of Pesticide Chemistry including the Symposium on Dispersion Dynamics of Pollutants in the Environment, Helsinki, Finland, 3–9 July 1974

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