Pure and Applied Chemistry

Abstract: A beamline equipped on the compact superconductive synchrotron radiation (SR) facility at Ritsumeikan University was designed for performing extended X-ray absorption fine structure (EXAFS) analyses of solutions and solids. The introduction of three different crystals, Si(220), Ge(220), and InSb(111), as the monochromator of the EXAFS spectrometer covers the K-edge absorption energy range of elements with low atomic numbers from silicon (atomic number 14) through zinc (30). The L_III-edge of the iodide ion could be measured by Si(220) and Ge(220). It is, however, not possible to measure the absorption of the bromide ion with this equipment. Using this spectrometer, the solvation structure of Cl^- and I^- ions was investigated in water, methanol, and ethanol under atmospheric pressure.