CrossRef enabled

PAC Archives

Archive →

Pure Appl. Chem., 2004, Vol. 76, No. 1, pp. 91-96

Application of a compact synchrotron radiation facility to studies on the structure of solvated chloride and iodide ions in various solvents

K. Ozutsumi and H. Ohtaki

Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, 1-1-1 Noji-Higashi, Kusatsu 525-8577, Japan

Abstract: A beamline equipped on the compact superconductive synchrotron radiation (SR) facility at Ritsumeikan University was designed for performing extended X-ray absorption fine structure (EXAFS) analyses of solutions and solids. The introduction of three different crystals, Si(220), Ge(220), and InSb(111), as the monochromator of the EXAFS spectrometer covers the K-edge absorption energy range of elements with low atomic numbers from silicon (atomic number 14) through zinc (30). The LIII-edge of the iodide ion could be measured by Si(220) and Ge(220). It is, however, not possible to measure the absorption of the bromide ion with this equipment. Using this spectrometer, the solvation structure of Cl- and I- ions was investigated in water, methanol, and ethanol under atmospheric pressure.