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Pure Appl. Chem., 1992, Vol. 64, No. 5, pp. 739-744

Photothermal characterization of plasma surface modifications

J. Pelzl and B. K. Bein

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  • Lan T. T. N., Seidel U., Walther H. G.: Theory of microstructural depth profiling by photothermal measurements. J Appl Phys 1995, 77, 4739. <>
  • Bein B.K., Gibkes J., Gu J.H., Hüttner R., Pelzl J., Balageas D.L., Déom A.A.: Thermal wave characterization of plasma-facing materials by IR radiometry. J  Nucl Mater 1992, 191-194, 315. <>