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Pure Appl. Chem., 1989, Vol. 61, No. 4, pp. 673-684

Design and surface synchrotron X-ray structure analysis of Langmuir films for crystal nucleation

E. M. Landau, S. G. Wolf, J. Segiv, M. Deutsch, K. Kjaer, J. Als-Nielsen, L. Leiserowitz and M. Lahav

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